Specialty Labs



Equipment Techniques
  • Focused Ion Beam (NP Test FIB)
  • Atomic Foce Microscope (Veeco Dimension 3100)
  • Light Emission Analysis (Hypervision / Probe Stage)
  • Laser Cutting
  • Laser Scanning (Checkpoint)
  • OBIC (Checkpoint)
  • Photoemission (Checkpoint)
  • Real Time X-Radiography (Fein Focus-Tiger)
  • Real Time X-Radiography (Dage)
  • Scanning Acoustic Microscopy (Sonix) (2)
  • Low and High Power Optical (12)
  • X-ray fluorescence (XRF)
  • X-ray tomography (Dage)
  • On Chip Die Modification
  • Insulator / Metal Deposition
  • Precision Cross Sections
  • High Resolution Imaging
  • SCM and SRM Imaging
  • Failure Site Isolation
  • Dielectric Luminescence / Thermal Radiation
  • Circuit Isolation
  • PEM Non-invasive Inspections
  • Hermetic Non-invasive Inspections
  • Delamination / Voiding Detection
  • Up-Screening Inspections / Qual Testing
ISO9001:2008 and AS9100B Registered Company: ISO9001:2008 - Certificate No. 0031322; AS9100B - Certificate No. 0044524
Analytical Solutions Inc. 10401 Research Rd. SE, Albuquerque NM, 87123 Phone (505)299-1967; Fax (505-292-0225) Directions