SEM Lab



Equipment Techniques
  • Hitachi S-4700 FESEM (2)
  • Hitachi S-4800 FESEM
  • JEOL 845IC
  • ABT 32
  • EDS (Noran Light Element) (2)
  • IDS5000
  • Probe Stage
  • EBIC Amplifiers(3)
  • Cathodoluminescence
  • Auto Photo Stitching Sofware
  • Backscattered Electron Imaging
  • SEM Inspection
  • Material Identification
  • EBIC Failure Isolation
  • Static Voltage contrast
  • Dynamic Voltage Contrast
  • Electron Beam Induced Current Imaging
  • Crystallographic Defect Isolation
  • SEM Photo to GDSII Conversion
ISO9001:2008 and AS9100B Registered Company: ISO9001:2008 - Certificate No. 0031322; AS9100B - Certificate No. 0044524
Analytical Solutions Inc. 10401 Research Rd. SE, Albuquerque NM, 87123 Phone (505)299-1967; Fax (505-292-0225) Directions